Convolutional Multiple Whole Profile fitting Main Page

CMWP-fit is a program for evaluating diffraction profiles using the method of Convolutional Multiple Whole Profile fitting. If you want to know more about the method and the program, click here. A detailed help is available in the documentation page.

This program package is freely available for non-commercial, scientific purposes, provided that the COPYRIGHT terms are fulfilled. For commercial requests, please contact the authors. Please check and accept the COPYRIGHT terms before proceeding. By accepting the terms and conditions and filling up the (C)MWP Registration form, you'll get access to the (C)MWP program package, you can either download it and install it on your own linux computer, or by using your username and password you can use (without the necessity of any software installation) the WWW frontend of the program (this page).

IMPORTANT NOTE to previous users: due to restructurization of the CMWP frontend, all older accounts were deactivated and the old data files were archived and deleted. We are sorry for the inconvenience. If you need your old data, please contact us. Please register using the new (C)MWP Registration form (you can use your old username and password) and either continue using the WWW frontend or download the program and use it on your own computer.

Users can acces the program via this page:
you can upload your patterns,
upload your instrumental profile files,
view the list of your samples,
or start the evaluation program.
You can also view the results of previous runs.
There is also a documentation page.
Please note that in order to save disk space, all data (which is stored in the CMWP frontend) older than six months will be automatically deleted.

Alternatively, you can go to the CMWP download page.

Here you can find some example data which might be useful for testing:

Al6Mg6: pattern of Al 6wt.% Mg alloy ball milled for 6 hours measured on a Philips X'Pert theta-2theta diffractometer (Ribarik et al., 2004)
LaB6-xpert-inst-dat: instrumental profiles of LaB6 measured on the same Philips X'Pert theta-2theta diffractometer (Ribarik et al., 2004)

The physical parameters are given in the corresponding .ini files.

This procedure is similar to the method of Multiple Whole Profile fitting, however the CMWP method is more sophisticated, so you should use the CMWP method when possible.

MKDAT is a program for preparing X-ray diffraction data. The outputs of MKDAT can be used as the peak indexing file, as the background spline's base points file as well as the instrumental profile files for the CMWP program. Follow this link to download it.